Electrical and Computer Engineering Department doctoral candidate Pritish Narayanan, a student of ECE Professor C. Andras Moritz (pictured), has received the Best Student Paper Award at the Institute of Electrical and Electronics Engineers (IEEE) International Symposium on Defect and Fault Tolerance in VLSI (Very Large Scale Integration) Systems, held in Kyoto, Japan, from October 6 to 8. The title of the paper was “Parameter Variability in Nanoscale Fabrics: Bottom-Up Integrated Exploration,” and its co-authors include Dr. Moritz and ECE graduate students Michael Leuchtenburg, Prachi Joshi, and Pavan Panchapakeshan.
The paper was a collaborative effort between the research group of Professor Moritz and that of Professor Chi On Chui (also a co-author) at UCLA.
The conference is an annual symposium providing an open forum for presentations in the field of defect and fault tolerance in VLSI systems inclusive of emerging technologies. One of the unique features of this symposium is to combine new academic research with state-of-the-art industrial data, necessary ingredients for significant advances in this field. All aspects of design, manufacturing, test, reliability, and availability that are affected by defects during manufacturing and by faults during system operation are of interest. (October 2010)