Alodeep Sanyal, a doctoral student in the Electrical and Computer Engineering Department, has won a third-place certificate in the influential E. J. McCluskey Doctoral Thesis Competition, sponsored by the Institute of Electrical and Electronics Engineers Test Technology Technical Council. Selection was based on the quality of his thesis, a poster presentation, and an interview by the award committee. The name of Sanyal’s thesis is, “On Detection, Analysis, and Characterization of Transient and Parametric Failures in CMOS VLSI.”
The award serves to promote impactful doctoral student work, to provide students with the exposure to the community and prospective employers, and to support interaction between academia and industry in the field of test technology. This major award has recently been named after Prof. Edward J. McCluskey, a key educator and mentor in the fields of test technology, logic design, and reliability.
Since 2005, the thesis award in test technology has been presented annually to the winner of a contest, which took place at the IEEE VLSI Test Symposium. This was a two-step process, begun this year, in order to increase the worldwide participation of doctoral students. In the first step, candidates were selected based on preliminary review of their theses. Then they were invited to the VLSI Test Symposium for poster presentations. At the presentation, they were also interviewed by the award committee. (June 2010)